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Parcourir ICHEC-ECAM-ISFSC par auteur "Flandre, Denis"
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Characteristics of noise degradation and recovery in gamma-irradiated SOI nMOSFET with in-situ thermal annealing. .
2022, Amor, Sedki; Kilchytska, Valeriya; Tounsi, Fares; André, Nicolas; Machhout, M.; FRANCIS, Laurent; Flandre, DenisArticle Scientifique -
New Universal Figure of Merit for Embedded Si Piezoresistive Pressure Sensors.
2021, Delhaye, Thibault; André, Nicolas; FRANCIS, Laurent; Flandre, DenisArticle Scientifique -
An Ultra-Low-Power Read-Out Circuit for Interfacing Novel Gas Sensors Matrices.
2022, Puyol Troisi, Rafael; Pétré, Sylvain; Danlée, Yann; Walewyns, Thomas; FRANCIS, Laurent; Flandre, DenisArticle Scientifique -
Variation Range of Different Inductor Topologies with Shields for RF and Inductive Sensing Applications.
2022, Tounsi, Fares; Hadj Said, Mohamed; Hauwaert, Margo; Kaziz, Sinda; FRANCIS, Laurent; Raskin, Jean-Pierre; Flandre, DenisArticle Scientifique