dc.rights.license | OTH | en_US |
dc.contributor.author | LECOINTRE, Julien | |
dc.contributor.author | Jureta, J.J. | |
dc.contributor.author | Defrance, P. | |
dc.date.accessioned | 2021-02-19T21:01:26Z | |
dc.date.available | 2021-02-19T21:01:26Z | |
dc.date.issued | 2008 | |
dc.identifier.uri | https://luck.synhera.be/handle/123456789/662 | |
dc.identifier.doi | doi:10.1088/0953-4075/41/9/095204 | en_US |
dc.description.abstract | Absolute cross sections for electron-impact single and multiple ionization of Ne+ leading to the formation of Neq+ (q = 2–5) are reported. The animated crossed beams method is applied in the energy range from the respective thresholds up to 2.5 keV. The maximum cross sections are found to be (4.12 ± 0.21) × 10−17 cm2, (1.42 ± 0.07) × 1018 cm2, (2.57 ± 0.14) × 10−20 cm2, (8.78 ± 0.54) × 10−22 cm2 for the multiply-charged products Neq+ (q = 2–5), respectively. The corresponding threshold energies are measured to be (41.0 ± 0.5) eV, (105 ± 1) eV, (205 ± 5) eV and (345 ± 15) eV. Present data are compared with available experimental and theoretical results. | en_US |
dc.description.sponsorship | INT | en_US |
dc.language.iso | EN | en_US |
dc.publisher | IOP Physics | en_US |
dc.relation.ispartof | Journal of Physics B: Atomic, Molecular and Optical Physics | en_US |
dc.relation.isreferencedby | https://iopscience.iop.org/article/10.1088/0953-4075/41/9/095204 | en_US |
dc.rights.uri | https://iopscience.iop.org/article/10.1088/0953-4075/41/9/095204 | en_US |
dc.subject | Molecular Physics | en_US |
dc.title | Electron-impact ionization of singly-charged neon ions | en_US |
dc.type | Article scientifique | en_US |
synhera.classification | Physique, chimie, mathématiques & sciences de la terre | en_US |
synhera.institution | HENALLUX | en_US |
synhera.otherinstitution | UCLouvain | en_US |
synhera.cost.total | 0 | en_US |
synhera.cost.apc | 0 | en_US |
synhera.cost.comp | 0 | en_US |
synhera.cost.acccomp | 0 | en_US |
dc.description.version | Oui | en_US |
dc.rights.holder | UCLouvain | en_US |