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Electron impact multiple ionization of argon ions

dc.rights.licenseOTHen_US
dc.contributor.authorLECOINTRE, Julien
dc.contributor.authorDefrance, P.
dc.contributor.authorBelic, D. S.
dc.date.accessioned2021-02-15T20:16:17Z
dc.date.available2021-02-15T20:16:17Z
dc.date.issued2010
dc.identifier.urihttps://luck.synhera.be/handle/123456789/630
dc.identifier.doidoi:10.1088/0953-4075/43/18/185203en_US
dc.description.abstractAbsolute cross sections for electron impact single and multiple ionization of argon ions leading to the formation of Ar q + (q = 2–8) are reported. The animated crossed beam method is applied in the energy range extending from the respective thresholds up to 2.5 keV. The maximum cross sections for the multiply charged products Ar q + (q = 2–8) are measured to be (12.6 ± 0.6) × 10−17 cm2 for Ar2+, (4.96 ± 0.21) × 10−18 cm2 for Ar3+, (5.50 ± 0.23) × 10−19 cm2 for Ar4+, (8.10 ± 0.33) × 10−20 cm2 for Ar5+, (8.2 ± 0.7) × 10−21 cm2 for Ar6+, (8.9 ± 0.8) × 10−22 cm2 for Ar7+ and (5.5 ± 1.6) × 10−23 cm2 for Ar8+. The corresponding threshold energies are determined to be (27.4 ± 0.5) eV, (68.7 ± 0.5) eV, (135 ± 2) eV, (250 ± 10) eV, (310 ± 10) eV, (480 ± 20) eV and (640 ± 40) eV for the production of Ar q + (q = 2–8), respectively. The direct process is seen to dominate for q = 2–3, while the indirect processes are dominant for charge states 4–8.en_US
dc.description.sponsorshipINTen_US
dc.language.isoENen_US
dc.publisherIOP PUBLISHINGen_US
dc.relation.ispartofJOURNAL OF PHYSICS B: ATOMIC, MOLECULAR AND OPTICAL PHYSICSen_US
dc.relation.isreferencedbyhttps://iopscience.iop.org/article/10.1088/0953-4075/43/18/185203en_US
dc.rights.urihttps://iopscience.iop.org/article/10.1088/0953-4075/43/18/185203en_US
dc.subjectMolecular physicsen_US
dc.titleElectron impact multiple ionization of argon ionsen_US
dc.typeArticle scientifiqueen_US
synhera.classificationPhysique, chimie, mathématiques & sciences de la terreen_US
synhera.institutionHENALLUXen_US
synhera.otherinstitutionUCLouvainen_US
synhera.cost.total0en_US
synhera.cost.apc0en_US
synhera.cost.comp0en_US
synhera.cost.acccomp0en_US
dc.description.versionOuien_US
dc.rights.holderUCLouvainen_US


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